Showing results: 76 - 90 of 456 items found.
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Keysight Technologies
The laser head is the source of the laser beam used in all laser motion and position measurement systems. The primary difference between laser heads is in the velocity, reference frequency and optical output power. Other considerations are size, heat dissipation, and input power requirements. Which laser you choose depends primarily on the application in which it will be used. For example, semiconductor lithography systems typically have faster moving parts (stages), and therefore need higher velocities than machine tool applications.
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FemtoFiber ultra 1050 -
TOPTICA Photonics Inc
The FemtoFiber ultra 1050 is part of TOPTICA's third generation of ultrafast fiber lasers. The system delivers laser pulses of 90 - 100 fs in duration at a central wavelength of 1050 nm. Using a power amplifier the system provides more than 5 W average output power. It is a compact femtosecond laser system with turnkey operation and cost-effective design.
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OPTOWARE-S400 (HPLDS) -
Notice
100W High Power Laser Dreiver System
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Rincon SS -
Del Mar Photonics, Inc.
Specifically developed for measuring a wide array of output parameters from ultrafast laser systems including: contrast ratio of laser pulses, determining pulse pedestal, pre- and post-pulses, and amplified spontaneous emission in femtosecond systems.
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LasEasy V1.0 -
UVisIR Inc.
LasEasy software is the professional software for simulating and designing solid-state laser cavity, optical amplifier system, and parametric OPO systems. It can also simulate the laser light propagation in both horizontal and vertical (sangital and tangitial) planes.
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Quantum Composers
The piezo laser modules include an attenuator, a filter wheel, an X-Y aperture, and a rotating waveplate. These compact laser modules can be integrated independently or can be daisy-chained together into laser beam delivery systems and have a damage threshold of 5 J/cm2. Attenuator modules connected together can also provide independent control of energy in multiple wavelength systems.
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NT342 Series -
EKSPLA uab
NT342 series tunable laser system comprises a nanosecond optical parametric oscillator and Q-switched pump laser in a single housing. The system features up to 50 mJ in VIS, no-gap wavelength tuning from 192 nm to 2600 nm, up to 30 Hz repeptition rate, easy maintenance and separate output for pump laser beam.
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thicknessGAUGE.laser profile -
Micro-Epsilon Group
thicknessGAUGE.laser profile sensor systems use laser profile scanners for the thickness measurement. These scanners project a laser line onto the surface to be measured. The laser line compensates for strip tilting and enables profile averaging. The laser line measuring technique makes it possible to measure the thickness of structured materials such as embossed surfaces and perforated plates.
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DataRay Inc.
DataRay offers specialized beam profiler systems. These systems offer solutions for complex applications. The large beam profiling system is suitable for beams up to 200 mm image area, and the line laser profiling system provides for direct measurement of line lasers up to 200 mm in length.
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PicoQuant GmbH
PicoQuant's compact and reliable turn-key diode laser solutions work in picosecond pulsed, modulated, or fast-switched (nsec to µsec) operation mode. The laser systems typically consist of a common driver unit and exchangeable heads. Specialized lasers are also available as stand-alone units.
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Becker & Hickl GmbH
DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.
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PCE Instruments
The PCE laser distance meter is the ideal device to ascertain the measurements of distance without bulky reel-in tapes, or walking wheel distance measurement systems. The PCE laser distance meter is made to the highest industry standards for resolution and durability. The laser distance meter is used for accurately determining the distance of an object or span without contact by way of a laser. The basic measuring principle is based on measuring the transit time of laser pulses between the laser distance meter and the object to be measured. Considering the speed of light, distances can be determined precisely with a laser distance meter.
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PCE Instruments
The PCE laser distance meter is the ideal device to ascertain the measurements of distance without bulky reel-in tapes, or walking wheel distance measurement systems. The PCE laser distance meter is made to the highest industry standards for resolution and durability. The laser distance meter is used for accurately determining the distance of an object or span without contact by way of a laser. The basic measuring principle is based on measuring the transit time of laser pulses between the laser distance meter and the object to be measured. Considering the speed of light, distances can be determined precisely with a laser distance meter.
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PCE Instruments
The PCE laser distance meter is the ideal device to ascertain the measurements of distance without bulky reel-in tapes, or walking wheel distance measurement systems. The PCE laser distance meter is made to the highest industry standards for resolution and durability. The laser distance meter is used for accurately determining the distance of an object or span without contact by way of a laser. The basic measuring principle is based on measuring the transit time of laser pulses between the laser distance meter and the object to be measured. Considering the speed of light, distances can be determined precisely with a laser distance meter.
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Bodkin Design & Engineering, llc
When lasers are used to illuminate an object, a standing patter of laser ‘speckle’ is projected onto the target. This irregularity in illumination is detrimental to imaging systems and can increase the uncertainty in sensor measurements.
